Download PDF by Earl J. Kirkland: Advanced Computing in Electron Microscopy

By Earl J. Kirkland

Advanced Computing in Electron Microscopy, second version, brings jointly assorted info on snapshot simulation. a useful source, this ebook offers info on a number of tools for numerical computation of excessive solution traditional and scanning transmission electron microscope photographs. this article is going to function a useful tool for college students on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.

This greater moment version comprises:

-descriptions of latest advancements within the field

-updated references

-additional fabric on aberration corrected tools and confocal electron microscopy

-expanded and more advantageous examples and sections to supply greater clarity

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Extra resources for Advanced Computing in Electron Microscopy

Sample text

These are images of a self-luminous point which is the probe function in STEM neglecting any remaining source size coming from the tip itself. 7 Aberration Correction The most common electron lens is a rotationally symmetric lens similar to that shown in Fig. 2. The fringe field in the gap focus the electron beam. 5 Fig. 5. 8 2 Fig. 5Cs λ . 7 Aberration Correction 21 Fig. 12 Various single aberrations. All images are of a 200 keV probe (or self luminous point) ˚ (b) defocus of 100 A, ˚ (c) twofold astigmawith a 20 mrad apert.

And Tech. , 1999 [36] 3. D. K. Bowen and C. R. Hall, Microscopy of Materials, MacMillan Press, 1975 [35] 4. M. De Graf, Intro. to Conventional Transmission Electron Microscopy, Cambridge Univ. Press, 2003 [129] 5. J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976 [87] 6. B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001 [120] 7. C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966 [141] 8.

Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 1945 [394] Chapter 3 Linear Image Approximations Abstract This chapter presents approximations for simple calculation of CTEM and STEM (BF, ADF, and confocal) images using linear image models. A linear image is the convolution of an object function and the point spread function (multiplication in Fourier transform space). This can provide a simple intuitive approach to interpreting the electron micrographs although it might not be particularly accurate.

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