By Earl J. Kirkland
Advanced Computing in Electron Microscopy, second version, brings jointly assorted info on snapshot simulation. a useful source, this ebook offers info on a number of tools for numerical computation of excessive solution traditional and scanning transmission electron microscope photographs. this article is going to function a useful tool for college students on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.
This greater moment version comprises:
-descriptions of latest advancements within the field
-additional fabric on aberration corrected tools and confocal electron microscopy
-expanded and more advantageous examples and sections to supply greater clarity
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Extra resources for Advanced Computing in Electron Microscopy
These are images of a self-luminous point which is the probe function in STEM neglecting any remaining source size coming from the tip itself. 7 Aberration Correction The most common electron lens is a rotationally symmetric lens similar to that shown in Fig. 2. The fringe field in the gap focus the electron beam. 5 Fig. 5. 8 2 Fig. 5Cs λ . 7 Aberration Correction 21 Fig. 12 Various single aberrations. All images are of a 200 keV probe (or self luminous point) ˚ (b) defocus of 100 A, ˚ (c) twofold astigmawith a 20 mrad apert.
And Tech. , 1999  3. D. K. Bowen and C. R. Hall, Microscopy of Materials, MacMillan Press, 1975  4. M. De Graf, Intro. to Conventional Transmission Electron Microscopy, Cambridge Univ. Press, 2003  5. J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976  6. B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001  7. C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966  8.
Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 1945  Chapter 3 Linear Image Approximations Abstract This chapter presents approximations for simple calculation of CTEM and STEM (BF, ADF, and confocal) images using linear image models. A linear image is the convolution of an object function and the point spread function (multiplication in Fourier transform space). This can provide a simple intuitive approach to interpreting the electron micrographs although it might not be particularly accurate.